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IP’s Growing Impact On Yield And Reliability

By Ann Steffora Mutschler, Semiconductor Engineering | Featuring Vladislav Palfy, Director of Applications Engineering, OneSpin

Managing IP quality and compatibility is becoming more difficult at advanced nodes and in safety-critical markets.

Chipmakers are finding it increasingly difficult to achieve first-pass silicon with design IP sourced internally and from different IP providers, and especially with configurable IP.


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